Meet PAR Authors at the NASP 2011 Annual Convention

PAR staff are arriving in San Francisco to kick off the start of the National Association of School Psychologists (NASP) Annual Convention. If you are attending NASP, be sure you stop by the PAR booth to take a look at some of our new products, including the Reynolds Child Depression Scale™–2nd Edition (RCDS™-2) and Reynolds Child Depression Scale™–2nd Edition: Short Form (RCDS™-2:SF), the State-Trait Anger Expression Inventory–2™ Child and Adolescent (STAXI-2™ C/A), and the Emotional Disturbance Decision Tree™–Parent Form (EDDT™-PF).

Don’t forget, NASP attendees receive 15% off plus free shipping on all orders placed during the conference!

Don’t miss presentations by PAR authors Bryan Euler, Thomas Brunner, and Peter Isquith.

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